Reference : Detection of a MoSe2 secondary phase layer in CZTSe by spectroscopic ellipsometry
Scientific journals : Article
Physical, chemical, mathematical & earth Sciences : Physics
http://hdl.handle.net/10993/22513
Detection of a MoSe2 secondary phase layer in CZTSe by spectroscopic ellipsometry
English
Demircio glu, Ozden [University of Oldenburg > Laboratory for Chalcogenide Photovoltaics, Energy and Semiconductor Research Laboratory]
Mousel, Marina mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Redinger, Alex mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Rey, Germain mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Weiss, Thomas Paul mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Siebentritt, Susanne mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Riedel, Ingo [University of Oldenburg > Laboratory for Chalcogenide Photovoltaics, Energy and Semiconductor Research Laboratory]
Gütay, Levent mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
2015
JOURNAL OF APPLIED PHYSICS
118
185302-1
Yes
International
http://hdl.handle.net/10993/22513

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