Reference : Atom probe tomography study of internal interfaces in Cu2ZnSnSe4 thin-films
Scientific journals : Article
Physical, chemical, mathematical & earth Sciences : Physics
http://hdl.handle.net/10993/21958
Atom probe tomography study of internal interfaces in Cu2ZnSnSe4 thin-films
English
Schwarz, T. [Max-Planck-Institut fur Eisenforschung GmbH, Germany]
Cojocaru-Mir edin, O. [Max-Planck-Institut fur Eisenforschung GmbH, Germany]
Choi, P. [Max-Planck-Institut fur Eisenforschung GmbH, Germany]
Mousel, Marina mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Redinger, Alex mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Siebentritt, Susanne mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
Raabe, D. [Max-Planck-Institut fur Eisenforschung GmbH, Germany]
2015
Journal of Applied Physics
American Institute of Physics
118
095302 1-10
Yes (verified by ORBilu)
0021-8979
1089-7550
Melville
NY
http://hdl.handle.net/10993/21958
10.1063/1.4929874

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