Reference : Line-Sweep: Cross-Ratio for Wide-Baseline Matching and 3D Reconstruction
Scientific congresses, symposiums and conference proceedings : Paper published in a book
Engineering, computing & technology : Computer science
http://hdl.handle.net/10993/20806
Line-Sweep: Cross-Ratio for Wide-Baseline Matching and 3D Reconstruction
English
Ramalingam, Srikumar [Mitsubishi Electric Research Laboratories (MERL)]
Goncalves Almeida Antunes, Michel mailto [University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > >]
Snow, Daniel [Mitsubishi Electric Research Laboratories (MERL)]
Lee, Gim Hee [Mitsubishi Electric Research Laboratories (MERL)]
Pillai, Sudeep [Massachussetts Institute of Technology (MIT)]
2015
IEEE Conference on Computer Vision and Pattern Recognition (CVPR)
Yes
International
IEEE Conference on Computer Vision and Pattern Recognition (CVPR)
7-06-2015 to 12-06-2015
[en] line matching ; 3D Reconstruction
http://hdl.handle.net/10993/20806

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