Reference : Effective Fault Localization via Mutation Analysis: A Selective Mutation Approach
Scientific congresses, symposiums and conference proceedings : Paper published in a book
Engineering, computing & technology : Computer science
http://hdl.handle.net/10993/16860
Effective Fault Localization via Mutation Analysis: A Selective Mutation Approach
English
Papadakis, Mike mailto [University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT) > >]
Le Traon, Yves mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC) >]
2014
ACM Symposium On Applied Computing (SAC'14)
Yes
29th ACM Symposium On Applied Computing
March 24 - 28, 2014
http://hdl.handle.net/10993/16860

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