Reference : Secondary Ion Mass Spectrometry in combination with cesium deposition: fundamentals a...
Dissertations and theses : Doctoral thesis
Physical, chemical, mathematical & earth Sciences : Physics
http://hdl.handle.net/10993/15634
Secondary Ion Mass Spectrometry in combination with cesium deposition: fundamentals and applications
English
Bendler, Beatrix [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Physics and Materials Science Research Unit >]
24-Sep-2012
University of Luxembourg, ​Luxembourg, ​​Luxembourg
Docteur en Physique
Siebentritt, Susanne mailto
Wirtz, Tom
http://hdl.handle.net/10993/15634

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