Reference : SESAME: A Model-Driven Test Selection Process for Safety-Critical Embedded Systems
Scientific journals : Article
Engineering, computing & technology : Computer science
http://hdl.handle.net/10993/1107
SESAME: A Model-Driven Test Selection Process for Safety-Critical Embedded Systems
English
Guelfi, Nicolas mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC) >]
Ries, Benoît mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC) >]
Oct-2008
ERCIM News
ERCIM
75
Safety-Critical Software
Yes
International
0926-4981
Sophia-Antipolis
France
[en] safety-critical ; embedded systems ; methodology ; software engineering ; test selection
http://hdl.handle.net/10993/1107

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