Reference : Defect engineering of 2D monatomic-layer materials
Scientific journals : Article
Physical, chemical, mathematical & earth Sciences : Multidisciplinary, general & others
Computational Sciences
http://hdl.handle.net/10993/10209
Defect engineering of 2D monatomic-layer materials
English
Peng, Q. [Department of Mechanical, Aerospace and Nuclear Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, United States]
Crean, J. [Department of Mechanical, Aerospace and Nuclear Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, United States]
Dearden, A. K. [Department of Physics, Applied Physics and Astronomy, Rensselaer Polytechnic Institute, Troy, NY 12180, United States]
Huang, C. [Theoretical Division, Los Alamos National Laboratory, Los Alamos, NM 87545, United States]
Wen, X. [Theoretical Division, Los Alamos National Laboratory, Los Alamos, NM 87545, United States]
Bordas, Stéphane mailto [University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Engineering Research Unit >]
De, S. [Department of Mechanical, Aerospace and Nuclear Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, United States]
2013
Modern Physics Letters B
27
23
Yes (verified by ORBilu)
International
02179849
[en] Defect engineering
[en] Atomic-thick monolayer two-dimensional materials present advantageous properties compared to their bulk counterparts. The properties and behavior of these monolayers can be modified by introducing defects, namely defect engineering. In this paper, we review a group of common two-dimensional crystals, including graphene, graphyne, graphdiyne, graphn-yne, silicene, germanene, hexagonal boron nitride monolayers and MoS2 monolayers, focusing on the effect of the defect engineering on these two-dimensional monolayer materials. Defect engineering leads to the discovery of potentially exotic properties that make the field of two-dimensional crystals fertile for future investigations and emerging technological applications with precisely tailored properties. © World Scientific Publishing Company.
# BRBAA08-C-2-0130, DTRA, Defense Threat Reduction Agency; # HDTRA1-13-1-0025, DTRA, Defense Threat Reduction Agency
Researchers ; Professionals ; Students ; General public
http://hdl.handle.net/10993/10209
10.1142/S0217984913300172
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