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See detailDetection of a MoSe2 secondary phase layer in CZTSe by spectroscopic ellipsometry
Demircio glu, Ozden; Mousel, Marina UL; Redinger, Alex UL et al

in JOURNAL OF APPLIED PHYSICS (2015), 118

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See detailAtom probe tomography study of internal interfaces in Cu2ZnSnSe4 thin-films
Schwarz, T.; Cojocaru-Mir edin, O.; Choi, P. et al

in Journal of Applied Physics (2015), 118

Detailed reference viewed: 124 (5 UL)