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See detailInvestigation of current collapse in doped and undoped AlGaN/GaN HEMTs
Wolter, M.; Javorka, P.; Marso, Michel UL et al

in Proc. 4th Intern. Conf. Advanced Semicon. Dev. & Microsystems (2002)

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See detailPhotoionization spectroscopy of traps in AlGaN/GaN HEMTs
Wolter, M.; Javorka, P.; Marso, Michel UL et al

in Journal of Electronic Materials (2002), 31(12), 1321-1324

Detailed reference viewed: 13 (0 UL)